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Advanced Embedded Debug with Jitter and Real-Time Eye Analysis

Advanced Embedded Debug with Jitter and Real-Time Eye Analysis

Serial links can fail even when every individual transition looks acceptable. Timing variation, noise, bandwidth limits and the receiver's clock-recovery behaviour combine to determine whether each bit is sampled correctly. Jitter analysis and eye diagrams turn those effects into measurements that can be compared across board revisions, firmware builds and design changes. The goal is not to c...
Advanced Embedded Debug with Jitter and Real-Time Eye Analysis

Bode Plot Analysis of switching Power Supplies

Overview A Bode plot is a graph that maps the frequency response of the system. It was first introduced by Hendrik Wade Bode in 1940. The Bode plot consists of the Bode magnitude plot and the Bode phase plot. Both the amplitude and phase graphs are plotted against the frequency. The horizontal axis is lgω (logarithmic scale to the base of 10), and the logarithmic scale is used. The vertical a...
Advanced Embedded Debug with Jitter and Real-Time Eye Analysis

Debug & Analysis of IoT Power Requirements

Battery life is an operating-profile problem, not a single current reading. A connected device can spend most of its time in microamp sleep, wake for milliseconds, draw a large radio burst and return to sleep. A useful measurement therefore has to capture peak current, charge per event, time in each state and the frequency of those states. Turn the user requirement into a power budget Oper...
Advanced Embedded Debug with Jitter and Real-Time Eye Analysis

Utilising Deep Memory with Rigol DS1000 Oscilloscope

Oscilloscope memory determines how long an acquisition can remain while retaining useful time resolution. The original DS1000D/E instructions described a one-million-point record as deep memory. Current instruments may provide tens or hundreds of millions of points, but the underlying trade-off is unchanged: time span, sample rate, active channels and record length must be considered together. ...
Advanced Embedded Debug with Jitter and Real-Time Eye Analysis

Debug and Analysis Considerations for Optimising Signal Integrity in Your Internet of Things Design

An embedded bus can decode correctly on the bench and still fail after the enclosure, flex cable, sensor stack or production wiring is introduced. Signal-integrity testing should therefore establish a repeatable analogue baseline, reproduce what the digital receiver sees and track margin as the mechanical and firmware design changes. Measure the physical signal before trusting the decode Ex...
Advanced Embedded Debug with Jitter and Real-Time Eye Analysis

Meeting Embedded Design Challenges with Mixed Signal Oscilloscopes

Embedded systems combine analogue behaviour, digital state and serial communications. A mixed-signal oscilloscope brings those views onto one timebase so an engineer can connect a corrupted transaction to its electrical cause, firmware state or analogue response. Four error classes to separate TimingCheck setup, hold, clock-to-data relationships, interrupt latency and the delay from a comm...
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RIGOL´s new Solution for EMI pre-compliance tests

VNA Mode for Real-Time Spectrum Analysers Enhanced EMI measurement function and a simple user-friendly operating environment complete RIGOL’s real time spectrum analyser versions RSA3000N and RSA5000N. Electromagnetic compatibility [EMC] has become one of the most important topics in the last 23 years. EMC activities during design phase are absolutely mandatory to ensure the functionality ...
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Power grid test capabilities in the field of new energy

These products can be used as central devices in the power grid tests for distributed power generation with sunlight, wind, fuel cells, and gas engines. They provide a platform for testing systems in connection with loads, electric power analyzers, and other devices....
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Ideal for EMC and power supply standard tests

The response speed of the PCR-LE Series internal amplifier may be selected according to the required load conditions and purpose. Their stability for EMC test sites result in precise inspections. They are also applicable to power supply standard tests for aircraft-mounted systems that require a high level of precision....
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Dependable stability and high quality output

In addition to their rapid response characteristics, PCR-LE devices supply output voltage and frequency that can be changed at any time. Because they do not generate noise like those from the PWM inverter system, they produce power supply abnormality simulations easily and with a high level of precision for research and development and for instantaneous power failure tests on production and inspe...
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Reliability backed by a global track record

The entire PLZ Series is highly regarded by a wide range of users who deal with leading-edge technologies on a practical basis in many different disciplines. These loads have also been adopted for inspection systems by global manufacturers and research institutions involved with space development and information technology....
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High precision simulated load tests

These products accurately reproduce the desired discharge waveforms without using any real load. Simulated load tests may be conducted with great precision, considerably increasing the efficiency of power supply circuit evaluation....

Sub Categories

Application Notes

Knowledge Base AC Power Supplies

Knowledge Base PCR-LE Series (3)

Knowledge Base PCR-MA Series (3)

Knowledge Base PCR-WE/WE2 Series (2)

Knowledge Base Data Acquisition Systems

Knowledge Base M300 Series (2)

Knowledge Base DC Power Supplies

Knowledge Base DP700 Series (8)

Knowledge Base DP800 Series (26)

Knowledge Base PBZ Series (3)

Knowledge Base PMX-Multi Series (3)

Knowledge Base PWR-01 Series (3)

Knowledge Base SPD1000X (5)

Knowledge Base SPD3000X/X-E Series (6)

Knowledge Base Digital Multimeters

Knowledge Base DM3000 Series (21)

Knowledge Base SDM3000 Series (6)

Knowledge Base Digital Oscilloscopes

Knowledge Base DS1000 Series (46)

Knowledge Base DS2000 Series (36)

Knowledge Base MSO/DS7000 Series (35)

Knowledge Base MSO5000 Series (35)

Knowledge Base MSO8000 Series (32)

Knowledge Base SDS1000X-E Series (15)

Knowledge Base SDS2000X-E Series (15)

Knowledge Base SDS5000X Series (15)

Knowledge Base Electrical Safety Analysers

Knowledge Base TOS9300 Series (3)

Knowledge Base Electronic Loads

Knowledge Base DL3000 Series (2)

Knowledge Base PLZ-5W Series (3)

Knowledge Base PLZ-5WH Series (3)

Knowledge Base PLZ-5WH2 Series (3)

Knowledge Base SDL1000X Series (5)

Knowledge Base RF Signal Generators

Knowledge Base DSG800 Series (2)

Knowledge Base SSG3000X Series (4)

Knowledge Base Spectrum Analysers

Knowledge Base DSA800 Series (70)

Knowledge Base RSA3000 Series (32)

Knowledge Base RSA5000 Series (31)

Knowledge Base SSA3000X Plus Series (2)

Knowledge Base SSA3000X Series (15)

Knowledge Base SSA3000X-R Series (1)

Knowledge Base SVA1000X Series (13)

Knowledge Base Waveform Generators

Knowledge Base DG1000 Series (14)

Knowledge Base DG4000 Series (14)

Knowledge Base SDG1000X Series (10)

Knowledge Base SDG2000X Series (11)

Knowledge Base SDG6000X Series (11)

Knowledge Base SDG800 Series (10)