Advanced Embedded Debug with Jitter and Real-Time Eye Analysis , Telonic Instruments Ltd
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Advanced Embedded Debug with Jitter and Real-Time Eye Analysis

Posted on: June 17th, 2021 by Doug Lovell

Serial links can fail even when every individual transition looks acceptable. Timing variation, noise, bandwidth limits and the receiver’s clock-recovery behaviour combine to determine whether each bit is sampled correctly. Jitter analysis and eye diagrams turn those effects into measurements that can be compared across board revisions, firmware builds and design changes.

The goal is not to create the most attractive eye diagram. It is to reproduce what the receiver sees, identify the dominant impairment and confirm that a change improves margin without hiding another problem.

What to measure before opening an eye diagram

Timing

Measure period, frequency, rise/fall time and time-interval error using the correct reference or recovered clock.

Amplitude

Check high/low levels, noise, overshoot and vertical margin at the receiving end of the link.

Acquisition

Preserve enough sample rate and memory to observe rare events over a representative operating interval.

Probing

Minimise loading and ground inductance; verify that the probe and connection are not creating the symptom.

Use TIE to make timing movement visible

Time Interval Error (TIE) is the difference between an observed edge and the edge position predicted by the chosen clock model. A TIE trend shows how that error changes with time. A histogram shows how frequently different errors occur. Used together, they help separate periodic modulation, slow drift, discrete timing states and random variation.

Oscilloscope display showing a clock waveform and Time Interval Error trend
Existing application-note capture: the TIE trend makes periodic timing movement visible alongside the source waveform.

A repeating pattern in the TIE trend is a clue rather than a diagnosis. Measure its period, calculate the corresponding frequency and look for a time-correlated source such as a regulator, PLL control loop, periodic task, motor drive or nearby clock. Then repeat the acquisition after changing only that source or coupling path.

Choose the clock model deliberately

  • Use an explicit clock when the bus provides one and the receiver samples against it.
  • Use a constant reference only when that represents the real receiver behaviour.
  • Use an appropriate recovered-clock or PLL model for embedded-clock links.
  • Record the clock-recovery settings with the result; changing them can alter the apparent jitter dramatically.

Read an eye diagram as a fault-finding tool

The eye is built by aligning many unit intervals and overlaying them. Horizontal closure points towards timing uncertainty or limited settling time. Vertical closure points towards amplitude noise, attenuation, crosstalk or reference movement. Slow edges and unequal transition paths can indicate bandwidth, termination or loading problems.

Oscilloscope eye diagram with timing and amplitude closure
Existing application-note capture: an eye diagram combines repeated bit transitions to expose timing, noise and bandwidth margin.

Horizontal closure

Investigate clock stability, deterministic jitter, inter-symbol interference and the recovery model.

Vertical closure

Investigate supply noise, crosstalk, attenuation, probe loading and reference integrity.

Asymmetry

Compare rising/falling paths, duty cycle, termination and transmitter drive.

Outliers

Use long memory, search and segmented acquisition to find the operating event that produced them.

A repeatable debug sequence

  • Define the link, bit rate, probe point, receiver threshold and clock model.
  • Capture enough data to include the operating modes most likely to disturb the link.
  • Measure the baseline TIE trend and distribution before applying filters or masks.
  • Open the eye with the same clock model and record eye height, width and transition behaviour.
  • Correlate periodic features with power rails, firmware activity and neighbouring signals.
  • Change one variable and repeat the identical acquisition.
  • Save the setup, probes, firmware build and environmental conditions with the result.

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