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Siglent SMM3311X 1 Channel, ±210V, ±3.03A, 31.8W, 10fA, 100nV Resolution Source Measure Unit

£4069.00 (£4882.80 inc. VAT)

1 in stock (can be backordered)

Availability: Stock models delivered next working day (UK only) for orders placed before 16:30 (Mon - Fri)

SKU: SMM3311X Categories: , , Tag: Brand:

Description


Siglent SMM3311X Source Measure Unit, ±210V, ±3.03A, 10fA Resolution

The Siglent SMM3311X, ±210V, ±3.03A (10A Pulsed), 10fA, 100nV Resolution Source Measure Unit, part of the SMM3000X series, is a precise Source/Measure Unit (SMU) instrument that can simultaneously output and measure voltage and current. It integrates the functions of a current source, a voltage source, a voltmeter, and an ammeter within the instrument, allowing easy switching between these functions. The graphical user interface (GUI) it employs, along with advanced capacitive touchscreen technology, allows for intuitive operation.

The SMM3000X is the SMU for everyone: a versatile instrument, particularly well-suited for characterising modern scaled semiconductors, nano-scale devices and materials, organic semiconductors, printed electronics, and other small-geometry and low-power devices. It is widely used in fields such as research and educational applications, industrial development, testing, and manufacturing.

 

Applications
  • Testing semiconductors, discrete and passive components
  • Diodes, laser diodes, LEDs
  • Photodetectors, sensors
  • Field effect transistors (FETs), bipolar junction transistors (BJTs)
  • ICs(ICs, RFICs, MMICs)
  • Resistor, Varistor, thermistors, switches
  • Testing precision electronics and green energy devices
  • Photovoltaic cells
  • Power transistors, power devices
  • Battery, Automotive, Medical instruments
  • Power and DC bias source for circuit test
  • Research and education
  • New material investigations
  • Nano devices characterisation (e.g. CNT)
  • Giant magnetic resistance (GMR)
  • Organic devices, any precise voltage/current source and measurement
Key Features
  • Five-inch, high-resolution capacitive touchscreen GUI
  • Source and measurement resolution down to 10 fA and 100 nV
  • The maximum display digits: 6½(21,000,00 count)
  • The maximum sampling rate is 100ksps, the sampling interval is 0.0005 PLC, and the maximum setting is 100 PLC.
  • Minimum trigger interval 10 μs.
  • Up to 100k points of internal storage space, supporting timestamps.
  • Four-quadrant precision power supply with single/dual-channel output and measurement
  • Voltage (±210 V) and current (± 3 A DC and ±10.5 A pulsed) sourcing capability
  • Five basic functions: voltage/current sourcing, voltage/current/resistance measurement
  • The minimum programmable pulse width is 50 μs.
  • With arbitrary waveform generation and list scanning capabilities (minimum interval of 10 μs)
  • Supports two-wire/four-wire measurement modes
  • Supports SCPI remote control commands
  • Settable output filter
  • Configuration Interfaces: USB Device (optional USBGPIB adapter), USB Host, LAN
Functionality
  • Integrated 4-quadrant sourcing and measuring capabilities
  • Measurement range: ±210 V, ±3 A (DC), ±10.5 A (pulsed)
  • Source and measurement resolution down to 10 fA and 100 nV
  • Pulse, Sweep, List Sweep, Output Filter, Resistance measurement, Math Expression, Limit Test, Trace
  • Buffer, Protection, Trigger System, etc.
  • Versatile trigger modes,
  • 12 external trigger ports, 6 inputs, 6 outputs
  • Supports Web-serve

Product Images

High Resolution<br /> <br /> The SMU boasts excellent low-current measurement capability, making it suitable for measuring microampere-level currents and even smaller ones. Moreover, it offers a wider operating range and higher resolution than typical power supplies.<br /> <br /> Display Resolution: 61/2 (2,100,000 count)<br /> Programming/Readback Resolution:10fA/100nV<br />

High Resolution

Multi-view Display Mode<br /> <br /> Diversified chart display makes test results clear at a glance.<br />

Multi-view Display Mode

Sweep Function<br /> <br /> The SMU features multiple sweep modes, including single sweep, continuous sweep, linear/log sweep, pulse sweep and custom sweep. It can also be combined with limit testing and remote control modes to build a high-speed production testing system.<br /> <br /> The sweep function of the SMU can output voltage or current point-by-point at a fixed step size based on the user-prescribed start and end points, while automatically measuring the value at each point. It can verify the characteristics of the device at different operating points, and is often used to plot current-voltage (I-V) characteristic curves. For example, for semiconductor devices such as diodes and transistors, the corresponding current is measured by sweeping the voltage to obtain their conduction characteristic curves.

Sweep Function

Signal Generation Function<br /> <br /> The source measure unit can generate multiple types of signals to meet diverse testing requirements. Common signal types include DC signals and pulse signals. Users can precisely set signal parameters and adjust these parameters in real time to adapt to different testing needs.<br /> <br /> It can be applied to semiconductor device testing: used to measure the current-voltage (I-V) characteristic curves of devices such as transistors, diodes, and integrated circuits (ICs).

Signal Generation Function

×

High Resolution

The SMU boasts excellent low-current measurement capability, making it suitable for measuring microampere-level currents and even smaller ones. Moreover, it offers a wider operating range and higher resolution than typical power supplies.

Display Resolution: 61/2 (2,100,000 count)
Programming/Readback Resolution:10fA/100nV
Multi-view Display Mode

Diversified chart display makes test results clear at a glance.
Sweep Function

The SMU features multiple sweep modes, including single sweep, continuous sweep, linear/log sweep, pulse sweep and custom sweep. It can also be combined with limit testing and remote control modes to build a high-speed production testing system.

The sweep function of the SMU can output voltage or current point-by-point at a fixed step size based on the user-prescribed start and end points, while automatically measuring the value at each point. It can verify the characteristics of the device at different operating points, and is often used to plot current-voltage (I-V) characteristic curves. For example, for semiconductor devices such as diodes and transistors, the corresponding current is measured by sweeping the voltage to obtain their conduction characteristic curves.
Signal Generation Function

The source measure unit can generate multiple types of signals to meet diverse testing requirements. Common signal types include DC signals and pulse signals. Users can precisely set signal parameters and adjust these parameters in real time to adapt to different testing needs.

It can be applied to semiconductor device testing: used to measure the current-voltage (I-V) characteristic curves of devices such as transistors, diodes, and integrated circuits (ICs).

Product Videos

YouTube Video
Siglent's SMM3000X Source Measure Unit

Documentation


Siglent SMM3311X SMM3312X
Specification conditions
Temperature 23 °C ±5 °C
Humidity 30% to 80% RH
Calibration period 1 year
Measurement speed 1 PLC (power line cycle)
After 60 minutes of warm-up Ambient temperature change is less than ±3 °C after self-calibration execution
Outputs
Quadrants 4
Max. acquisition rate 100,000 points/s
Number of output channels 1 2
Max. output/sink power 31.8 W
DC or pulsed ±210 V ≤0.105 A
±21 V ≤1.515 A
±6 V ≤3.03 A
Pulsed only ±200 V ≤1.515 A
±6 V ≤10.5 A
Maximum current limitation
Max current limitation: For 21 V/1.515 A and 6 V/3.03 A ranges, the total max current is limited by the table below for using 2 channels. Max current is not limited to using only 1 channel.
I1: CH1 current
I2: CH2 current		 I1(CH1:±6V) + I2(CH2:±6V) ≤4A
I1(CH1:±6V) + I2(CH2:±6-21V)X1.6 ≤4A
I1(CH1:±6-21V) + I2(CH2:±6V)X0.625 ≤2.5A
I1(CH1:±6-21V) + I2(CH2:±6-21V) ≤2.5A

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