Rigol NFP-3 Near-Field Probe Set

Description

Rigol NFP-3 Probes

The Rigol NFP-3 is a set of four interchangeable magnetic near-field probes designed for locating and investigating sources of electromagnetic interference on printed circuit boards, electronic assemblies and individual components.

Used with a spectrum analyser, the probes allow engineers to scan around a device under test and identify the circuits, components and interconnections producing unwanted RF emissions. This makes the NFP-3 particularly useful during product development, EMC troubleshooting and pre-compliance testing, helping engineers find potential emissions problems before submitting equipment for formal EMC testing.

The four differently sized H-field probes provide a choice between higher sensitivity and finer spatial resolution. Larger probes are useful for surveying a wider area and identifying the general source of interference, while the smaller probes allow individual PCB traces, components and pins to be investigated more precisely.