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Description
Rigol NFP-3 Probes
The Rigol NFP-3 is a set of four interchangeable magnetic near-field probes designed for locating and investigating sources of electromagnetic interference on printed circuit boards, electronic assemblies and individual components.
Used with a spectrum analyser, the probes allow engineers to scan around a device under test and identify the circuits, components and interconnections producing unwanted RF emissions. This makes the NFP-3 particularly useful during product development, EMC troubleshooting and pre-compliance testing, helping engineers find potential emissions problems before submitting equipment for formal EMC testing.
The four differently sized H-field probes provide a choice between higher sensitivity and finer spatial resolution. Larger probes are useful for surveying a wider area and identifying the general source of interference, while the smaller probes allow individual PCB traces, components and pins to be investigated more precisely.
- Frequency range from 30 MHz to 3 GHz
- Four interchangeable magnetic near-field probes
- Helps locate sources of unwanted RF emissions
- Suitable for PCB, component and electronic-module investigation
- Different probe sizes balance sensitivity and spatial resolution
- Useful for EMC diagnostics and pre-compliance development work
- Quick-change SMB probe connections
- Supplied with RF cable, adaptor and protective storage case
- NFP-3-P1 near-field probe
- NFP-3-P2 near-field probe
- NFP-3-P3 near-field probe
- NFP-3-P4 near-field probe
- 1 metre BNC male to SMB female RF cable
- N male to BNC female adaptor
- Protective storage case
- Switch-mode power supplies and DC-DC converters
- Clock oscillators and high-speed digital circuits
- Microprocessors, memory devices and FPGAs
- PCB tracks, connectors and cables
- Power electronics and switching devices
- Electronic modules and complete assemblies
Rigol NFP-3 User Guide
martin-5924 (verified owner) –
This is a nice set of H field probes. The probe push-on connectors are a nice touch for quickly switching probes.