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Description
Langer EMV-Technik RF Basic set of near-field probes 30 MHz to 3 GHz
The Basic set Near-Field Probes 30 MHz to 3 GHz includes six passive near-field probes for development-related measurements of electric and magnetic fields in the frequency range of 30 MHz to 3 GHz on electronic assemblies. The various probe heads of the set enable step-by-step localisation of RF emission sources on an assembly and the investigation of coupling mechanisms.
The emission of the assembly is initially determined from a greater distance using the RF-R 400-1 and RF-E 02 probes. Subsequently, higher resolution probes such as the RF-R 3-2, RF-B 3-2, and RF-U 5-2 can be used to more precisely locate magnetic interference sources, while the RF-E 05 probe is used for electric interference sources. By carefully guiding the near-field probes, the magnetic field orientation and distribution on the electronic assembly can be determined.
The near-field probes are connected to a spectrum analyser or an oscilloscope with a 50 Ω input. However, the near-field probes do not have an internal 50 Ω termination resistor.
- 1x RF-R 400-1, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-R 3-2, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-B 3-2, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-U 2.5-2, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-E 02, E-Field Probe 30 MHz up to 1.5 GHz
- 1x RF-E 05, E-Field Probe 30 MHz up to 3 GHz
- 1x SMB-BNC 1 m, SMB-BNC Measurement Cable
- 1x Case 5, System Case Near-Field Probes for 5 Probes
RF Basic Set Datasheet
