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Microtest Impulse Winding Tester 7750-5S 100V~5200V

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Description


Microtest Impulse Winding Tester 7750-5S 100V~5200V

MICROTEST 7750-5S is a product in the 7550 Series. The 7750-5S is an advanced Impulse Winding Tester with a faster colour display screen. It provides pulse voltage outputs of 100V~5200V and utilizes high-speed sampling technology at 200MHz/9 bits. It offers various comparison modes such as total area, area difference, corona count, jitter count, second-order differentiation, and waveform comparison. With a testing speed of up to 10 times per second, it is ideal for high-speed production lines.

For testing small components, the optional 7750-1S tester comes with the FX-IM0001 four-wire SMD component testing fixture. It features voltage compensation to minimize voltage errors caused by wiring and equivalent inductance, ensuring accurate quality control for products with small inductance.

Features

  • Lowest Inductance (≥0.1μH)
  • High voltage calibration
  • programmable impulse voltage
  • 200MHz/9bit  High Impulse Test Sampling Rate
  • Total Area Comparison&lt
  • Differential Area Comparison
  • Corona  Comparison
  • LAPLACIAN Comparison
  • Voltage Compensation Function
  1. The meaning of the Corona, Flutter and Laplacian comparison:
    Corona comparison counts corona occurrence to detect discharge.
    Flutter comparison measures the total area of high-frequency waveform fluctuations to quantify waveform tremors.
    Laplacian comparison sums the second derivative of the waveform (the rate of change of the voltage change rate) to determine how much the high-frequency wave is fluttering. 
  2. Is the HV output grounded?
    Yes, the negative side of the output is grounded.     
  3. About the setup:
    The goal of all comparison modes is to measure discharge in different ways. There is no shared standard. The settings are usually found by trial and error.
    What I would recommend is to go through the following process:

    • Finish the initial waveform learning and standard setting.
    • Test at least 10-50 of the products that is on the production line and check the total yield of the batch.
    • If the yield is too low, the standard is too strict. Lower the test voltage or the pass limit.
    • If the yield is too high and you want stricter control, consider raising the pass limit or increasing the test level.

Product Images

When layer short happened, the loss of power on coil increase, the resonance damping coefficient increase, resonance amplitude decrease, the total area decrease. These are the basic parameters we check layer short.<br /> <br /> <br /> <br /> By calculating and comparing the deference of area between golden sample and DUT.<br /> <br /> <br /> Show by percentage<br /> Analysis the power loss by this data.

Total Area comparison

Add up the difference between normal wave and DUT wave call “ Area differential”.<br /> <br /> <br /> When layer short happened, the inductance reduce(similar the transformer). The wave phase change and the area differential also change. This will show “fail” on the instrument.<br /> <br /> <br /> However, the parameter might cause deviation because of the deviation of inductance, resonance phase shift. (Silicon steel product such as motor and traditional transformer is not suitable)<br /> <br /> <br /> <br /> By calculating and comparing the deference of area between golden sample and DUT. To determine the degree of waveform overlap.<br /> Compare the inductance by this.

Differential area comparison

In pulse test, the insulation defect will cause discharge and create corona. This function is able to count the times that corona happened base on the degree of deviation.<br /> <br /> <br /> Detect the discharge phenomenon on the coil.

Corona comparison

By setting an allowable waveform range for the standard wave, this feature can simultaneously determine the<br /> amplitude and phase of the resonant wave. It enhances the detection capability of inter-turn short circuits.

COMP Comparison

Poor insulation quality of the coil results in discharge under high voltage impact, causing rapid changes in the oscillation waveform. By employing the 7750 second-order differentiation algorithm, the maximum discharge capacity is obtained, effectively detecting quality issues related to electrical leakage caused by poor solder joints in the monolithic inductor.

LAPLACIAN Comparison

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When layer short happened, the loss of power on coil increase, the resonance damping coefficient increase, resonance amplitude decrease, the total area decrease. These are the basic parameters we check layer short.



By calculating and comparing the deference of area between golden sample and DUT.


Show by percentage
Analysis the power loss by this data.
Add up the difference between normal wave and DUT wave call “ Area differential”.


When layer short happened, the inductance reduce(similar the transformer). The wave phase change and the area differential also change. This will show “fail” on the instrument.


However, the parameter might cause deviation because of the deviation of inductance, resonance phase shift. (Silicon steel product such as motor and traditional transformer is not suitable)



By calculating and comparing the deference of area between golden sample and DUT. To determine the degree of waveform overlap.
Compare the inductance by this.
In pulse test, the insulation defect will cause discharge and create corona. This function is able to count the times that corona happened base on the degree of deviation.


Detect the discharge phenomenon on the coil.
By setting an allowable waveform range for the standard wave, this feature can simultaneously determine the
amplitude and phase of the resonant wave. It enhances the detection capability of inter-turn short circuits.
Poor insulation quality of the coil results in discharge under high voltage impact, causing rapid changes in the oscillation waveform. By employing the 7750 second-order differentiation algorithm, the maximum discharge capacity is obtained, effectively detecting quality issues related to electrical leakage caused by poor solder joints in the monolithic inductor.

Product Videos

YouTube Video
7750 Impulse Winding Tester
YouTube Video
Microtest 7750 Impulse Winding Tester Operation Demo
YouTube Video
MICROTEST | 7750 PC Link Software Demo
YouTube Video
The correct way to detect short circuits between coil layers. Impulse Winding Tester ｜7750 VS 7703

Documentation



Model 7750-5E 7750-5H 7750-5S 7750-1S 7750-10S
Impulse Voltage 100V~5200V 100V~5200V 100V~5200V 10V~1200V 200V~10000V
Voltage Resolution 1V 1V 1V 0.1V 5V
Test Inductance Range ≥1μH ≥1μH ≥1μH ≥0.1μH ≥20μH
Impulse Voltage Accuracy ±（1% of setting ＋ 10V） ±（1% of setting ＋ 10V） ±（1% of setting ＋ 10V） ±（1% of setting ＋ 5V） ±（1% of setting ＋ 20V）
Pulse Number Max 32
Sampling Rate 50MHz/9 bit 100MHz/9 bit 200MHz/9 bit
Test Time 10 times/ Sec
Input Impedance 20MΩ
Waveform Comparison
AREA Comparison ●
DIFF Comparison ●
CORONA Comparison ●
WAVEFORM Comparison ●
FLAT Comparison ●
LAPLACIAN Comparison –
Breakdown Voltage – – ● ● ●
Measurement Statistics ●

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