RIGOL: Understanding Jitter Measurement in High-Speed Signal Analysis

As data rates continue to increase across modern electronic systems, timing accuracy becomes increasingly important. Even small variations in signal timing, known as jitter, can impact performance, reliability, and compliance.

RIGOL’s latest application note explores the fundamentals of jitter measurement using oscilloscopes, covering key parameters such as Time Interval Error (TIE), Cycle-to-Cycle Jitter, Duty Cycle Distortion, and pulse width measurements. The document also demonstrates practical measurement techniques for clock signals, NRZ data signals, PCIe signals, and PAM4 applications.

Whether you’re troubleshooting signal integrity issues or validating high-speed digital designs, understanding jitter is an essential part of the test process.

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